skip to main content
Show Results with:

Field emission from thick carbon nanotube film on Si substrate

Wang, Q. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 478-480 -- John Wiley,; 2004 (pages 478-480) -- 2004

Check library holdings

  • Title:
    Field emission from thick carbon nanotube film on Si substrate
  • Author: Wang, Q.;
    Zhu, C.-C.;
    Shi, Y.;
    Danoix, F.;
    Forbes, R. G.;
    Watts, J. F.
  • Found In: Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 478-480
  • Conference Title: Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.
  • Subjects: Field emission; IFES; Vacuum microelectronics; Microelectronics; IVMC
  • Publication Details: John Wiley,; 2004
  • Language: English
  • Place Name: Lyon, France
  • Description: Held in conjunction with the 15th International vacuum microelectronics conference.; See also 5072.21013 vol 21 no 4 2003 for further selected papers
  • Identifier: Journal ISSN: 0142-2421
  • Publication Date: 2004
  • Physical Description: Physical
  • Shelfmark(s): 8547.742000
  • UIN: ETOCCN052111612

Searching Remote Databases, Please Wait