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TEM Characterization of Highly Oriented Diamond Films on (001) Silicon Synthesized by Bias-Enhanced Nucleation Technique

Jeon, S.-J. et al.

Materials Research Society symposia proceedings.; Interfacial engineering for optimized properties; Boston; MA, 1996; Dec, 1997, 429-434 -- MRS; 1997 Part: Part; (pages 429-434) -- 1997

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  • Title:
    TEM Characterization of Highly Oriented Diamond Films on (001) Silicon Synthesized by Bias-Enhanced Nucleation Technique
  • Author: Jeon, S.-J.;
    Chawla, A. K.;
    Baik, Y.-J.;
    Sung, C.;
    Briant, C. L.;
    Carter, C. B.;
    Hall, E. L.
  • Found In: Materials Research Society symposia proceedings.; Interfacial engineering for optimized properties; Boston; MA, 1996; Dec, 1997, 429-434
  • Conference Title: Materials Research Society symposia proceedings.
  • Subjects: interfacial engineering; optimized properties; MRS; materials research
  • Publication Details: MRS; 1997
  • Language: English
  • Place Name: Boston; MA
  • Identifier: Conference ISBN: 1558993622
  • Publication Date: 1997
  • Physical Description: Physical
  • Shelfmark(s): 5396.412000
  • UIN: ETOCCN020741928

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