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Low-Frequency Noise in UHV/CVD Epitaxial Si and SiGe Bipolar Transistors

Vempati, L. S. et al.

IEEE journal of solid-state circuits.; GaAs IC; San Diego; CA, 1995; Oct, 1996, 1458-1467 -- IEEE; 1996 Part: Part 10; (pages 1458-1467) -- 1996

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  • Title:
    Low-Frequency Noise in UHV/CVD Epitaxial Si and SiGe Bipolar Transistors
  • Author: Vempati, L. S.;
    Cressler, J. D.;
    Babcock, J. A.;
    Jaeger, R. C.;
    Madihan, M.;
    Wang, K. C.
  • Found In: IEEE journal of solid-state circuits.; GaAs IC; San Diego; CA, 1995; Oct, 1996, 1458-1467
  • Conference Title: IEEE journal of solid-state circuits.
  • Subjects: GaAs IC; bipolar circuits; IEEE; bicmos circuits; high speed circuits
  • Publication Details: IEEE; 1996
  • Language: English
  • Place Name: San Diego; CA
  • Description: Held with the bipolar/bicmos circuits and technology meeting
  • Identifier: Journal ISSN: 0018-9200
  • Publication Date: 1996
  • Physical Description: Physical
  • Shelfmark(s): 4362.985500
  • UIN: ETOCCN015963115

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