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An objective assessment of analytical method precision: comparison of ICP-AES and XRF for the analysis of silicate rocks

Ramsey, M. H. et al.

Chemical geology.; Analytical spectroscopy in the earth sciences; Kingston-upon-Thames, 1993; Jun, 1995, 1-20 -- Elsevier; 1995 Part: Part 1/2; (pages 1-20) -- 1995

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  • Title:
    An objective assessment of analytical method precision: comparison of ICP-AES and XRF for the analysis of silicate rocks
  • Author: Ramsey, M. H.;
    Potts, P. J.;
    Webb, P. C.;
    Watkins, P.;
    Jarvis, I.;
    Jarvis, K. E.
  • Found In: Chemical geology.; Analytical spectroscopy in the earth sciences; Kingston-upon-Thames, 1993; Jun, 1995, 1-20
  • Conference Title: Chemical geology.
  • Subjects: analytical spectroscopy; earth sciences
  • Publication Details: Elsevier; 1995
  • Language: English
  • Place Name: Kingston-upon-Thames
  • Description: See also 4362.0654 vol 19 no 4 1993 for abstracts
  • Identifier: Journal ISSN: 0168-9622
  • Publication Date: 1995
  • Physical Description: Physical
  • Shelfmark(s): 3146.550000
  • UIN: ETOCCN010032805

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